Micro- and Nanostructure Characterization

A highly experienced and sophisticated microstructural facility to evaluate products and materials.

  • X-ray Diffraction (XRD) Analysis
  • X-ray Fluorescence Spectroscopy (XRF) Analysis
  • Focussed Ion Beam (FIB) Milling
  • Transmission Electron Microscopy (TEM) Analysis
  • Atomic Force Microscopy (AFM) Analysis
  • Advanced Optical Characterization
  • Profilometry Analysis